| AVS 45th International Symposium | |
| Thin Films Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | TF-ThA1 Invited Paper Ex-situ Characterization of Polycrystalline Thin Films K. Barmak, J. Rickman, Lehigh University |
| 2:40pm | TF-ThA3 TEM Study of Defects, Domains and Vacancy Ordering in Ga@sub 2@Se@sub 3@/GaAs(100) and Ga@sub 2@Se@sub 3@/Si(111) Thin Films Z.R. Dai, S.R. Chegwidden, S. Meng, University of Washington, K. Ueno, A. Koma, University of Tokyo, Japan, M.A. Olmstead, F.S. Ohuchi, University of Washington |
| 3:00pm | TF-ThA4 Sputtered Deposition of Ni@sub 3@Al Thin Films G.B. Thompson, X.D. Zhang, R. Grylls, R. Banerjee, P.M. Anderson, H.L. Fraser, Ohio State University |
| 3:20pm | TF-ThA5 Roughness Measurements With X-Rays Using an Out-Of-Plane Scattering Geometry J.J. Kelly IV, J. Con Foo, J.F. MacKay, M.G. Lagally, University of Wisconsin, Madison |
| 3:40pm | TF-ThA6 Accurate Thin Film Density Measured by Energy-Dispersive X-ray Reflectivity W.E. Wallace, W.L. Wu, National Institute of Standards and Technology |
| 4:00pm | TF-ThA7 Structure and Electronic Properties of the Novel Semiconductor Alloy Cd@sub 1-x@Cu@sub x@Te S. López-López, G. Torres-Delgado, S.J. Jiménez-Sandoval, O. Jiménez-Sandoval, R. Castanedo-Pérez, Cinvestav-IPN, Mexico |
| 4:20pm | TF-ThA8 Thickness-Dependence of Infrared Reflection-Absorption Spectra from Thin Film of Anatase-type TiO@sub2@ Grown on Polished MgO(001) Substrate by Ar-ion Beam Sputtering D. Osabe, T. Uchitani, K. Maki, Yokohama City University, Japan |
| 4:40pm | TF-ThA9 Rutherford Backscattering and Channeling Studies of Al and Mg Diffusion in Iron Oxide Thin Films S. Thevuthasan, W. Jiang, D.E. McCready, S.A. Chambers, Pacific Northwest National Laboratory, N.R. Shivaparan, R.J. Smith, Montana State University |
| 5:00pm | TF-ThA10 Advances in the Characterization of Thin (<30 nm) TiN Films Using SIMS A.V. Li-Fatou, G.R. Mount, V.K.F. Chia, Charles Evans & Associates |