AVS 45th International Symposium | |
Thin Films Division | Thursday Sessions |
Session TF-ThA |
Session: | Ex-situ Characterization of Thin Films |
Presenter: | Z.R. Dai, University of Washington |
Authors: | Z.R. Dai, University of Washington S.R. Chegwidden, University of Washington S. Meng, University of Washington K. Ueno, University of Tokyo, Japan A. Koma, University of Tokyo, Japan M.A. Olmstead, University of Washington F.S. Ohuchi, University of Washington |
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