| AVS 45th International Symposium | |
| Nanometer-scale Science and Technology Division | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | NS+AS-FrM1 Nanoscale Variations in Surface Potentials at Interfaces B.D. Huey, D.A. Bonnell, University of Pennsylvania |
| 8:40am | NS+AS-FrM2 Noncontact Measurement of Electrical Dissipation using Ultrasensitive Cantilevers T.D. Stowe, Stanford University, D. Rugar, IBM Almaden Research Center, D.J. Thomson, University of Manitoba, Canada, T.W. Kenny, Stanford University |
| 9:00am | NS+AS-FrM3 Invited Paper Nanocalorimetry for Thermodynamic Measurements of Nanostructures L.H. Allen, University of Illinois, Urbana-Champaign |
| 9:40am | NS+AS-FrM5 Invited Paper Recent Advances in Scanning Capacitance Microscopy C.C. Williams, J.S. McMurray, V.V. Zavyalov, J. Kim, University of Utah |
| 10:20am | NS+AS-FrM7 Nanometer-scale Electrical Characterization of Semiconductor with a Scanning Capacitance Microscope H. Tomiye, Y. Takafumi, Tohoku University, Japan |
| 10:40am | NS+AS-FrM8 A Study on the Post-stress Charges in SiO@sub2@ Films on Si by Scanning Capacitance Microscope K. Mang, Samsung Electronics, Korea, C.J. Kang, G.H. Buh, C.K. Kim, S. Lee, C. Im, Y. Kuk, Seoul National University, Korea |
| 11:00am | NS+AS-FrM9 Imaging Buried Interfacial Lattices with Quantized Electrons I.B. Altfeder, D.M. Chen, The Rowland Institute for Science |
| 11:20am | NS+AS-FrM10 Nanoparticle Near-Field Spectroscopy by a Microscopically Narrow (Subnanometer) Electron-Beam H. Cohen, Weizmann Institute of Science, Israel, T. Maniv, Technion, Israel, Y. Rosenfeld Hacohen, R. Tenne, Weizmann Institute of Science, Israel, O. Stephan, C. Colliex, University of Paris-Sud, France |