| AVS 45th International Symposium | |
| Nanometer-scale Science and Technology Division | Friday Sessions |
| Session NS+AS-FrM |
| Session: | Innovative Nanoscale Measurements |
| Presenter: | I.B. Altfeder, The Rowland Institute for Science |
| Authors: | I.B. Altfeder, The Rowland Institute for Science D.M. Chen, The Rowland Institute for Science |
| Correspondent: | Click to Email |