| AVS 45th International Symposium | |
| Electronic Materials and Processing Division | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | EM-FrM1 Optical, Structural, and Morphological Properties of Epitaxial Al@sub x@Ga@sub (1-x)@N(0001) Films Grown by Gas-Source Molecular Beam Epitaxy J.E. Van Nostrand, Air Force Research Laboratory, R.L. Hengehold, Air Force Institute of Technology, K.D. Leedy, M.L. Seaford, D.H. Tomich, C.E. Stutz, Q.-H. Xie, Air Force Research Laboratory |
| 8:40am | EM-FrM2 Investigation of High Temperature Characteristics of Metal-Insulator-Semiconductor Diode Structures Fabricated Using BN Layers Grown on GaN and SiC D. Starikov, N. Badi, I. Berichev, N. Medelci, A. Tempez, V. Zomorrodian, A. Bensaoula, University of Houston |
| 9:00am | EM-FrM3 Chemical Beam Epitaxy of GaAsN on GaAs (100) J.W. Rogers, Jr., C.L. Aardahl, H.K. Yun, T.P. Pearsall, University of Washington |
| 9:20am | EM-FrM4 InP Photocathode Surface Preparation by Atomic Hydrogen Cleaning K.A. Elamrawi, M.A. Hafez, H. Elsayed-Ali, Old Dominion University |
| 9:40am | EM-FrM5 Deposition and Electroluminescent Properties of Sputter Deposited Zn(x)Mg(1-x)S:Mn M.R. Davidson, K.E. Waldrip, J.S. Lewis, D. Moorehead, B. Speck, P.H. Holloway, University of Florida, Gainesville, S.S. Sun, Planar Systems, Inc. |
| 10:00am | EM-FrM6 Small Area XPS Analysis of Silicon Wafers Employing Cu Line Technology E. Principe, R. Brigham, T.J. Schuerlein, Charles Evans & Associates |
| 10:20am | EM-FrM7 Epitaxial Ferroelectric Ba@sub (1-x)@Sr@sub x@TiO@sub 3@ Thin Films for Tunable Microwave Devices C.L. Chen, F.F. Feng, Z.H. Zhang, A. Brazdeikis, University of Houston, F.A. Miranda, Lewis Research Center, Y. Liou, W.K. Chu, C.W. Chu, University of Houston |
| 10:40am | EM-FrM8 Reaction Pathways/Energetics for Chemical Attack of Amorphous Si-O-F and C-F-(H,OH) Low-k Dielectric Thin Films by Water Molecules H. Yang, G. Lucovsky, North Carolina State University |
| 11:00am | EM-FrM9 Carbon Incorporation in SiGeC Alloys Grown by UHV/CVD A.C. Mocuta, D.W. Greve, Carnegie Mellon University |
| 11:20am | EM-FrM10 XPS Study of the Role of Ti and TiN Caps on the Cobalt / SiO@sub 2@ Interface T. Conard, IMEC, MAPFCA, Belgium, E. Kondoh, W. Vandervorst, IMEC, Belgium |