| AVS 62nd International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | SP+AS+MI+NS+SS-FrM1 Invited Paper Direct Visualization of Magnetoelectric Domains in Hexagonal Manganites Weida Wu, Rutgers University |
| 9:00am | SP+AS+MI+NS+SS-FrM3 Kelvin Probe Force Microscopy Studies of Magnetic Atoms on Ultrathin Insulating MgO Film Taeyoung Choi, W. Paul, S. Baumann, C.P. Lutz, A. Heinrich, IBM Almaden Research Center |
| 9:20am | SP+AS+MI+NS+SS-FrM4 Nanoscale Schottky Barrier Height Mapping Utilizing Ballistic Electron Emission Microscopy C. Durcan, W. Nolting, College of Nanoscale Science and Engineering, Vincent LaBella, SUNY Polytechnic Institute |
| 9:40am | SP+AS+MI+NS+SS-FrM5 Electron Transport Studies of Metal Films Utilizing Ballistic Electron Emission Microscopy Christopher Durcan, SUNY College of Nanoscale Science and Engineering, V. LaBella, SUNY Polytechnic Institute |
| 10:00am | SP+AS+MI+NS+SS-FrM6 Utilizing Ballistic Electron Emission Microscopy to Study Sidewall Scattering of Electrons Westly Nolting, C. Durcan, R. Balsano, College of Nanoscale Science and Engineering, University of Albany, V. LaBella, College of Nanoscale Science and Engineering, SUNY Polytechnic Institute |
| 10:20am | SP+AS+MI+NS+SS-FrM7 Invited Paper Progress in Nanoscale Magnetic Resonance Imaging Daniel Rugar, IBM Research Division |
| 11:00am | SP+AS+MI+NS+SS-FrM9 Reactive Intermediates Created and Analyzed by Scanning Probe Microscopy Bruno Schuler, IBM Research - Zurich, Switzerland, N. Pavliček, IBM Research - Zurich, S. Collazos, CIQUS, Universidade de Santiago de Compostela, N. Moll, S. Fatayer, IBM Research - Zurich, D. Pérez, E. Guitán, CIQUS, Universidade de Santiago de Compostela, G. Meyer, IBM Research - Zurich, D. Peña, CIQUS, Universidade de Santiago de Compostela, L. Gross, IBM Research - Zurich |
| 11:20am | SP+AS+MI+NS+SS-FrM10 The Negative Stiffness and Positive Damping of Squeezed Air in Dynamic Atomic Force Microscopy x. Yu, M. Tao, Nancy Burnham, Worcester Polytechnic Institute |