AVS 62nd International Symposium & Exhibition
    Scanning Probe Microscopy Focus Topic Friday Sessions
       Session SP+AS+MI+NS+SS-FrM

Paper SP+AS+MI+NS+SS-FrM3
Kelvin Probe Force Microscopy Studies of Magnetic Atoms on Ultrathin Insulating MgO Film

Friday, October 23, 2015, 9:00 am, Room 212A

Session: Probe-Sample Interactions
Presenter: Taeyoung Choi, IBM Almaden Research Center
Authors: T. Choi, IBM Almaden Research Center
W. Paul, IBM Almaden Research Center
S. Baumann, IBM Almaden Research Center
C.P. Lutz, IBM Almaden Research Center
A. Heinrich, IBM Almaden Research Center
Correspondent: Click to Email

The interplay of single atoms and their local environment on surfaces influences the atoms’ spin excitations and dynamics, which can be utilized in progress toward atomic-scale memory and quantum information processing. We find that spin-excitation energy of Fe atoms on an insulating MgO film shifts depending on the tip-to-atom separation. This may be attributed to the electric field across the tunneling junction, as well as to local charge and structural changes around the atom. The Kelvin Probe Force Microscopy (KPFM) has been very useful tool to measure changes of local contact potential differences between a tip and a sample at the atomic level [1]. In this talk, we employ tuning fork KPFM/STM and show preliminary results on the charge character and spin excitations of Fe atoms.

This work is supported by grants from IBM.

[1] Leo Gross et al., Phys. Rev. B 90, 155455 (2014).