| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-ThP1 Applications of EMSL’s Radiochemistry Annex (RadEMSL) in Understanding of the Chemical Fate and Transport of Radionuclides in Terrestrial and Subsurface Ecosystems Mark Engelhard, Pacific Northwest National Laboratory |
| AS-ThP2 XPS and AES Characterization of Tribofilm Formation on Non-Metallic Coatings Using ZDDP and Ionic Liquid Lubricant Additives Harry Meyer III, J. Qu, Z.B. Cai, C. Ma, H. Luo, Oak Ridge National Laboratory |
| AS-ThP3 XPS Sputter Depth Profiling of Organometallic Multilayer Materials using Massive Argon Cluster Ions Simon Hutton, Kratos Analytical Limited, UK, T. Bendikov, Weizmann Institute of Science, Israel, W. Boxford, S.C. Page, J.D.P. Counsell, A.J. Roberts, C.J. Blomfield, S.J. Coultas, Kratos Analytical Limited, UK |
| AS-ThP4 XPS Analysis and Sample Preparation for EBSD Analysis using Argon Gas Clusters Adam Bushell, Thermo Fisher Scientific, UK, R. Simpson, University of Surrey, UK, C.J. Stephens, C. Deeks, T.S. Nunney, J.P.W. Treacy, Thermo Fisher Scientific, UK |
| AS-ThP5 Comprehensive Characterization High-k Dielectric Films Deposited by ALD using Multi-Technique Surface Analysis Richard White, Thermo Fisher Scientific, UK |
| AS-ThP6 XPS and ToF-SIMS Characterization Functionalized 3D Mesostructures fabricated by Direct Laser Writing Michael Bruns, A. Welle, A.S. Quick, T. Claus, G. Delaittre, Karlsruhe Institute of Technology, Germany, T.S. Nunney, Thermo Fisher Scientific, UK, M. Wegener, C. Barner-Kowollik, Karlsruhe Institute of Technology, Germany |
| AS-ThP7 Structure, Surface Analysis, Photoluminescent Properties and Decay Characteristics of Tb3+-Eu3+ Co-Activated Sr2MgSi2O7 Phosphor M.A. Tshabalala, O.M. Ntwaeaborwa, University of the Free State, South Africa, Simon Dhlamini, University of South Africa |
| AS-ThP8 XPS Study of Many-Electron Interaction & Exchange Interaction of Local Moments in Ion Beam Synthesized Ternary Transition Metal Silicides Wickramaarachchige Lakshantha, M. Dhoubhadel, F. McDaniel, B. Rout, University of North Texas |
| AS-ThP9 Using ToF-SIMS to Characterize Surface Contamination in Sandia’s Z Machine James Ohlhausen, B. Clark, R. Tang, D. Lamppa, D. Susan, R. Sorensen, Sandia National Laboratories |
| AS-ThP10 Going Beyond Visualization: Exploiting Synergies Between Electron Microscopy and ToF-SIMS Kathryn Lloyd, C.D. Chan, J.R. Marsh, D.J. Walls, S. Subramoney, DuPont Corporate Center for Analytical Sciences |
| AS-ThP11 The Benefits of Using All of the Measured Mass Channels During MVSA of ToF-SIMS Data Sets Vincent Smentkowski, General Electric Global Research Center, M.R. Keenan, Independent Scientist, H. Arlinghaus, ION-TOF GmbH |
| AS-ThP12 Electron Gun Tilting and Shifting with O-Ring Stack System In-Yong Park, B. Cho, KRISS, Korea, C. Han, KBSI, Korea, D. Lee, S.J. Ahn, KRISS, Korea |
| AS-ThP13 Covalent Surface Modification of Silicon Oxide Substrate using Aliphatic Alcohols and Microwave Radiation Austin Lee, B.D. Gates, Simon Fraser University, Canada |
| AS-ThP16 XPS Analysis of Polycrystalline Samples (Bi3M)(Sb3M)O14 type Pyrochlore with M = Cu, Co and Zn Lazaro Huerta, R. Escamilla, M. Romero, Universidad Nacional Autonoma de Mexico, M. Flores, Universidad de Guadalajara, Mexico, A. Duran, Universidad Nacional Autonoma de Mexico |
| AS-ThP17 XPS Analysis of CNx Thin Films Niklas Hellgren, Messiah College, R. Haasch, University of Illinois at Urbana-Champaign, S. Schmidt, L. Hultman, Linköping University, Sweden, I. Petrov, University of Illinois at Urbana-Champaign |