Paper AS-ThP6
XPS and ToF-SIMS Characterization Functionalized 3D Mesostructures fabricated by Direct Laser Writing
Thursday, October 22, 2015, 6:00 pm, Room Hall 3
| Session: |
Applied Surface Science Poster Session |
| Presenter: |
Michael Bruns, Karlsruhe Institute of Technology, Germany |
| Authors: |
M. Bruns, Karlsruhe Institute of Technology, Germany
A. Welle, Karlsruhe Institute of Technology, Germany
A.S. Quick, Karlsruhe Institute of Technology, Germany
T. Claus, Karlsruhe Institute of Technology, Germany
G. Delaittre, Karlsruhe Institute of Technology, Germany
T.S. Nunney, Thermo Fisher Scientific, UK
M. Wegener, Karlsruhe Institute of Technology, Germany
C. Barner-Kowollik, Karlsruhe Institute of Technology, Germany
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| Correspondent: |
Click to Email |
In recent years significant effort has been spent to develop strategies for the fabrication of structured (bio)polymer modified surfaces on various substrates to alter the properties or to introduce entities with specific functions. These still ongoing activities are mainly stimulated by the wide range of applications in various scientific fields, such as lab-on-a-chip technology, biointerfaces, and tissue engineering. The utilization of photo-triggered Diels-Alder reactions in combination with shadow masking is an established efficient tool to achieve precise chemically structured surfaces in 2D.[1, 2] However, when aiming at the fabrication of complex 3D structures equipped with different surface functionalities, direct laser writing (DLW) is the method of choice. Most recently developed photoresists comprising e.g. orthogonal thiol-yne chemistry and click chemistry for a subsequent dual surface modification open up a facile avenue to fabricate various structures with several tailored functionalities.[3] In all cases surface analytical methods are indispensable to prove the successful chemical modification in a non-destructive manner. Therefore, the present contribution focuses on the characterization of such 3D structures using the combination of X-ray photoelectron spectroscopy (XPS) and complementary time-of-flight secondary ion mass spectrometry (ToF-SIMS). For non-patterned samples XPS quantitatively evidences the successful functionalization of surfaces for every single reaction step, whereas ToF-SIMS allows for rapid investigation of the chemical 2D patterning at high spatial resolution. For selected samples advanced parallel XPS imaging is additionally applied to calibrate the ToF-SIMS findings, obtaining quantitative information. For the chemical surface characterization of the well-defined 3D structures, ToF-SIMS proves an efficient tool for non-destructive 3D characterization of excellent spatial resolution with the advantage to achieve chemical/molecular information simultaneously.[1] T. Tischer, T. K. Claus, M. Bruns, V. Trouillet, K. Linkert, C. Rodriguez-Emmenegger, A. S. Goldmann, S. Perrier, H. G. Börner and C. Barner-Kowollik, Biomacromolecules 14 (2013) 4340−4350.
[2] T. Paulöhrl, G. Delaittre, V. Winkler, A. Welle, M. Bruns, H.G. Börner, A. M. Greiner, M. Bastmeyer, C. Barner-Kowollik, Angew. Chem. Int. Ed., 51 (2012) 1071–1074.
[3] A. S. Quick, A. de los Santos Pereira, M. Bruns, T. Bückmann, C. Rodriguez-Emmenegger, M. Wegener and C. Barner-Kowollik, Adv. Funct. Mat. 2015, in press.
This work was carried out with the support of the KNMF, a Helmholtz Research Infrastructure at KIT.