| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS+SS-ThA1 Invited Paper ASSD 30th Anniversary Lecture: Why Do (or Don’t) People use Chemical State XPS Imaging? Julia Fulghum, K. Artyushkova, University of New Mexico, A. Barlow, P. Cumpson, Newcastle University, UK |
| 3:00pm | AS+SS-ThA3 X-ray Photoelectron Spectromicroscopy: Combining Spectral and Spatial Information for Materials Characterization Adam Roberts, Kratos Analytical Limited, UK, N. Fairley, Casa Softaware Ltd, UK, J.R. Mora, University of Durham, UK |
| 3:20pm | AS+SS-ThA4 Optimizing XPS Imaging Acquisition Jon Treacy, C. Deeks, P. Mack, T.S. Nunney, Thermo Fisher Scientific, UK |
| 4:00pm | AS+SS-ThA6 Invited Paper Enhancing Chemical Contrast: Latest Trends in Hyperspectral Image Analysis Barry Wise, W. Windig, Eigenvector Research, Inc. |
| 4:40pm | AS+SS-ThA8 Unambiguous Molecular Identification with TOF-SIMS Imaging MS/MS G.L. Fisher, J.S. Hammond, Physical Electronics USA, R.M.A. Heeren, Maastricht University, The Netherlands, Scott Bryan, Physical Electronics USA |
| 5:00pm | AS+SS-ThA9 Utilizing Chemical State Mapping to Reveal Spatially Distributed Dynamics in Model Nanostructured Battery Electrodes Alexander Pearse, E. Gillette, S.B. Lee, G.W. Rubloff, University of Maryland, College Park |
| 5:20pm | AS+SS-ThA10 Microstructural and Chemical Mapping of Discharged Hybrid CFx–SVO Cathodes from Primary Li Batteries D. Reifsnyder Hickey, University of Minnesota, Jeffrey Fenton, K. Chen, P. Yurek, J. Lesser, G. Jain, Medtronic plc |
| 5:40pm | AS+SS-ThA11 A Novel Test Sample for the Spatially Resolved Quantification of Illicit Drugs on Fingerprints using Imaging Mass Spectrometry Shin Muramoto, T.P. Forbes, NIST, A.C. van Asten, Netherlands Forensic Institute, G. Gillen, NIST |