| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
| Session AS+SS-ThA |
| Session: | Advances in 2D Chemical Mapping and Data Analysis |
| Presenter: | Scott Bryan, Physical Electronics USA |
| Authors: | G.L. Fisher, Physical Electronics USA J.S. Hammond, Physical Electronics USA R.M.A. Heeren, Maastricht University, The Netherlands S.R. Bryan, Physical Electronics USA |
| Correspondent: | Click to Email |
First results from a new tandem imaging mass spectrometer will be presented. The unique TOF-TOF design allows the simultaneous collection of standard TOF-SIMS spectra and collision induced dissociation (CID) spectra of specifically selected precursors [1]. This new analytical capability maximizes the information content from a single acquisition and provides all data from the same analytical volume. The ability to acquire MS/MS data at the same primary ion beam repetition rate as used in conventional TOF-SIMS allows high speed image acquisition. The ability to unambiguously identify and image peaks above m/z 200 was applied to polymer additives and to the study of lipid composition changes in mouse spleen specimens infected with F. novicida.
[1] P.E. Larson, J.S. Hammond, R.M.A. Heeren and G.L. Fisher, Method and Apparatus to Provide Parallel Acquisition of MS/MS Data, U.S. Patent 20150090874, 02 April 2015.