| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
| Session AS+SS-ThA |
| Session: | Advances in 2D Chemical Mapping and Data Analysis |
| Presenter: | Julia Fulghum, University of New Mexico |
| Authors: | J. Fulghum, University of New Mexico K. Artyushkova, University of New Mexico A. Barlow, Newcastle University, UK P. Cumpson, Newcastle University, UK |
| Correspondent: | Click to Email |
XPS imaging can be used to acquire chemical-state specific information with a spatial resolution of several microns. In response to perceived user interest, instrument manufacturers have put significant resources into developing chemical state XPS imaging and image processing capabilities. Current instrumentation allows for parallel image acquisition over a range of photoelectron energies, resulting in quantitative, lateral surface chemistry determinations. Although publications citing XPS continue to increase, XPS imaging contributes to only a small percentage of published work.
In this talk, we’ll present an overview of laboratory XPS imaging capabilities using a variety of examples to demonstrate the practical (and not-so-practical) experiments that are possible. Recent multivariate and multitechnique analysis applications, including Multivariate Auger Feature Imaging (MAFI) and XPS-Raman image correlation will be used to highlight current research utilizing XPS imaging. Results from a survey of instrument manufacturers, directors of XPS user facilities, and expert users will be presented, including speculation as to why the use of XPS imaging has not met expectations, recommendations for using XPS imaging and hopes for future developments.