| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
| Session AS+SS-ThA |
| Session: | Advances in 2D Chemical Mapping and Data Analysis |
| Presenter: | Shin Muramoto, NIST |
| Authors: | S. Muramoto, NIST T.P. Forbes, NIST A.C. van Asten, Netherlands Forensic Institute G. Gillen, NIST |
| Correspondent: | Click to Email |