AVS 61st International Symposium & Exhibition
    Surface Science Friday Sessions

Session SS+EM-FrM
Semiconductor Surfaces and Interfaces 2

Friday, November 14, 2014, 8:20 am, Room 309
Moderators: Robert Bartynski, Rutgers, the State University of New Jersey, Kurt Kolasinski, West Chester University


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:20am SS+EM-FrM1
Two Dimensional Supramolecular Ordering of Oligothiophene Molecules on the Si(111) √3×√3-Ag Surface
R. Liu, Lakehead University, Canada, C. Fu, D.F. Perepichka, McGill University, Canada, Mark Gallagher, Lakehead University, Canada
8:40am SS+EM-FrM2
Interface Formation between a Self-Assembled Monolayer and an Organic Semiconductor
Sujitra Pookpanratana, H.-J. Jang, A.N. Brigeman, J.I. Basham, O.A. Kirillov, D.J. Gundlach, National Institute of Standards and Technology (NIST), O.D. Jurchescu, Wake Forest University, C.A. Richter, C.A. Hacker, NIST
9:00am SS+EM-FrM3
Reactions of Benzoquinone with Hydrogen Terminated Silicon Surfaces
R.L. Opila, Meixi Chen, N.A. Kotulak, N.J. Schreiber, University of Delaware
9:20am SS+EM-FrM4
High-Quality Monolayers Derived from Short Alkyne Chains on Si(111) Surfaces
Sidharam Pujari, A. Filippov, S. Gangarapu, H. Zuilhof, Wageningen University, Netherlands
9:40am SS+EM-FrM5
Surface Modification of Antimonide-Based Compound Semiconductor Superlattices using ALD
Erin Cleveland, J. Nolde, C. Canedy, E. Aifer, Naval Research Laboratory
10:00am SS+EM-FrM6
Mechanism Changes Caused by Metal Catalyst During Silicon Etching in V2O5 + HF Solutions
Kurt Kolasinski, W.B. Barclay, West Chester University
10:40am SS+EM-FrM8
Selective Wet Etching of III-V Semiconductors with HCl, H2O2, and α-Hydroxy Acid Mixtures
Pablo Mancheno-Posso, R. Jain, A.J. Muscat, University of Arizona
11:00am SS+EM-FrM9
Lanthanum Quantification for Optimization of Advanced High-k/Metal Gate Stacks using Low Energy Electron X-ray Emission Spectrometry
E. Martinez, CEA, LETI, MINATEC Campus, France, C. Trouiller, STMicroelectronics, France, M.P. Moret, N. Morel, CAMECA, France, Andrew Davis, CAMECA Instruments Inc, P. Caubet, STMicroelectronics, France, F. Bertin, CEA, LETI, MINATEC Campus, France