AVS 55th International Symposium & Exhibition
    Nanometer-scale Science and Technology Wednesday Sessions

Session NS+NC-WeM
Characterization and Imaging of Nanostructures

Wednesday, October 22, 2008, 8:00 am, Room 311
Moderator: R. Ruiz, Hitachi Global Storage Technologies Inc


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am NS+NC-WeM1 Invited Paper
Peter Mark Memorial Award Lecture: Probing the Order Parameter Dynamics and Energy Dissipation on a Single Defect Level: Hidden Dimensions of Scanning Probe Microscopy
S.V. Kalinin, Oak Ridge National Laboratory
8:40am NS+NC-WeM3
Quantitative Evaluation of Carbon Nano Tubes by the Scanning Atom Probe
O. Nishikawa, M. Taniguchi, Kanazawa Institute of Technology, Japan
9:00am NS+NC-WeM4
AgCl Monolayers on Au(111): Novel, Ultra-stable and Atomically-flat Surfaces
E.V. Iski, M. El-Kouedi, D.O. Bellisario, E.C.H. Sykes, Tufts University
9:20am NS+NC-WeM5
Atomic Scale Characterization of Charge Redistribution for Gallium Nanocluster Arrays on the Si(111)-7x7 Surface
Q.H. Wang, M.C. Hersam, Northwestern University
9:40am NS+NC-WeM6
QPlus AFM on Single Crystal Insulators with Small Oscillation Amplitudes at 5 K
M. Maier, Omicron NanoTechnology GmbH, Germany
10:40am NS+NC-WeM9
Nanoscale Characterization of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy
G. Acosta, R. Vanfleet, D. Allred, R. Turley, Brigham Young University
11:00am NS+NC-WeM10
Electron Structure of InGaAs/GaAs Quantum Dots in Limit of Small Sizes
I. Filikhin, J. Nimmo, M.H. Wu, B. Vlahovic, North Carolina Central University
11:20am NS+NC-WeM11
Characterization of Graphitic Coated Magnetic Nanoparticles used in Cancer Therapy
S. Trigwell, ASRC Aerospace, A.S. Biris, Y. Xu, Z. Li, M. Mahmood, University of Arkansas at Little Rock, T.S. Nunney, Thermo Fisher Scientific, UK
11:40am NS+NC-WeM12
Towards Automation in the Characterization of Nanostructured Materials and Devices
U. Schmidt, T. Dieing, M. Kress, K. Weishaupt, WITec GmbH, Germany