8:00am |
NS+NC-WeM1 Invited Paper
Peter Mark Memorial Award Lecture: Probing the Order Parameter Dynamics and Energy Dissipation on a Single Defect Level: Hidden Dimensions of Scanning Probe Microscopy S.V. Kalinin, Oak Ridge National Laboratory |
8:40am |
NS+NC-WeM3
Quantitative Evaluation of Carbon Nano Tubes by the Scanning Atom Probe O. Nishikawa, M. Taniguchi, Kanazawa Institute of Technology, Japan |
9:00am |
NS+NC-WeM4
AgCl Monolayers on Au(111): Novel, Ultra-stable and Atomically-flat Surfaces E.V. Iski, M. El-Kouedi, D.O. Bellisario, E.C.H. Sykes, Tufts University |
9:20am |
NS+NC-WeM5
Atomic Scale Characterization of Charge Redistribution for Gallium Nanocluster Arrays on the Si(111)-7x7 Surface Q.H. Wang, M.C. Hersam, Northwestern University |
9:40am |
NS+NC-WeM6
QPlus AFM on Single Crystal Insulators with Small Oscillation Amplitudes at 5 K M. Maier, Omicron NanoTechnology GmbH, Germany |
10:40am |
NS+NC-WeM9
Nanoscale Characterization of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy G. Acosta, R. Vanfleet, D. Allred, R. Turley, Brigham Young University |
11:00am |
NS+NC-WeM10
Electron Structure of InGaAs/GaAs Quantum Dots in Limit of Small Sizes I. Filikhin, J. Nimmo, M.H. Wu, B. Vlahovic, North Carolina Central University |
11:20am |
NS+NC-WeM11
Characterization of Graphitic Coated Magnetic Nanoparticles used in Cancer Therapy S. Trigwell, ASRC Aerospace, A.S. Biris, Y. Xu, Z. Li, M. Mahmood, University of Arkansas at Little Rock, T.S. Nunney, Thermo Fisher Scientific, UK |
11:40am |
NS+NC-WeM12
Towards Automation in the Characterization of Nanostructured Materials and Devices U. Schmidt, T. Dieing, M. Kress, K. Weishaupt, WITec GmbH, Germany |