AVS 55th International Symposium & Exhibition
    Nanometer-scale Science and Technology Wednesday Sessions
       Session NS+NC-WeM

Paper NS+NC-WeM6
QPlus AFM on Single Crystal Insulators with Small Oscillation Amplitudes at 5 K

Wednesday, October 22, 2008, 9:40 am, Room 311

Session: Characterization and Imaging of Nanostructures
Presenter: M. Maier, Omicron NanoTechnology GmbH, Germany
Correspondent: Click to Email

The creation and investigation of nano-structures, molecules or atomic structures on insulating surfaces is a key approach for electronic decoupling from the substrate. It pushes AFM as an complementary imaging and spectroscopy technique to STM. Ideally, the used AFM probe should simultaneously or alternatively work in STM/STS modes without performance compromises on the latter. Based on a proven low temperature (5K) LT STM platform, we have integrated a QPlus1 sensor, which employs a quartz tuning fork for force detection in non-contact AFM. For combined STM operation, this sensor has key advantages over conventional cantilevers: (i) a solid metal tip for optimal STM/STS and (ii) high stiffness and high stability, i.e. low vibrational noise due to small self-resonance amplitudes. For quantitative force spectroscopy on insulating thin films or semiconductors, decoupling of tunneling current and piezo-electrically induced AFM signal is important. By measurements on Si(111) and Au(111) we prove that only a dedicated pre-amplification technique can solve this problem. In addition, extremely low signals require the first amplification stage to be very close to the sensor, i.e. to be compatible with low temperatures. STS measurements using a Niobium tunneling tip reveal the superconducting gap with a FWHM of approx. 2.5 meV and prove a probe temperature of approx. 5K. The high stiffness (1800 N/m) of the sensor allows for operation with extremely small amplitudes to (i) more precisely keep the sensor with a certain force interaction regime, (ii) increase sensitivity especially for short range forces and (iii) allow for force measurements during atom manipulation experiments without disturbing the manipulation event as such.2 As benchmark measurement, we present atomic resolution imaging on single crystal NaCl with oscillation amplitudes down 100pm (peak-to-peak) in constant df imaging feedback. Optimal S/N ratio is achieved with a frequency noise down to 30mHz (peak-to-peak). We also present atomic resolution measurements on MgO(100), C60 molecules on Ag(111), and first evaluation measurements of the QPlus sensor in Kelvin Probe (KPM) mode operation.

1 F. J. Giessibl, et al., Appl. Phys. Lett. 73, 3956 (1998)
2 M. Ternes, et al., Science 319, 1066 (2008).