AVS 54th International Symposium
    Plasma Science and Technology Wednesday Sessions

Session PS1+NS-WeM
Plasmas in Nanotechnology

Wednesday, October 17, 2007, 8:00 am, Room 606
Moderator: S. Kodambaka, University of California, Los Angeles


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Click a paper to see the details. Presenters are shown in bold type.

8:00am PS1+NS-WeM1
Spectroscopic, Spatial, and Temporal Investigation of Fe Nanoparticle Synthesis by Through Thin Film Ablation
A.R. Waite, University of Dayton, Air Force Research Laboratory and UTC, Inc., P.T. Murray, University of Dayton, J.G. Jones, Air Force Research Laboratory, E. Shin, University of Dayton, A.A. Voevodin, Air Force Research Laboratory
8:20am PS1+NS-WeM2
Size Manipulation and Control of Nanoparticles Produced from Atmospheric-Pressure Microplasmas
N.A. Brunelli, K.P. Giapis, California Institute of Technology
8:40am PS1+NS-WeM3 Invited Paper
Ionic Plasmas Yielding Novel-Structured and -Functional Nanocarbons
R. Hatakeyama, T. Kaneko, W. Oohara, Y.F. Li, Tohoku University, Japan
9:20am PS1+NS-WeM5
Continuous-Flow Microplasma Synthesis of Metal Nanoparticles for Catalytic Growth of Carbon Nanotubes
W.-H. Chiang, R.M. Sankaran, Case Western Reserve University
9:40am PS1+NS-WeM6
Low Temperature Growth of Single-Walled Carbon Nanotubes by Oxygen-Assisted Inductively Coupled Plasma Chemical Vapor Deposition
C.-H. Hsiao, C.-H. Weng, Z.-Y. Juang, K.-C. Leou, C.-H. Tsai, National Tsing Hua University, Taiwan
10:40am PS1+NS-WeM9
Fabrication of Defect-Free and Diameter-Controlled Silicon Nanodisks for Future Quantum Devices by using Neutral Beam Etching
T. Hashimoto, T. Kubota, C.H. Huang, Tohoku Univ., Japan, M. Takeguchi, National Inst. for Mtls Sci., Japan, K. Nishioka, Japan Adv. Inst. of Sci. and Tech., Y. Uraoka, T. Fuyuki, Nara Inst. of Sci. and Tech., Japan, I. Yamashita, Matsushita Electric Industrial Co., Ltd, Japan, S. Samukawa, Tohoku Univ., Japan
11:00am PS1+NS-WeM10
Parallel Writing of Complex Nanofeatures using Nanopantography
L. Xu, A. Nasrullah, M. Jain, Z. Chen, V.M. Donnelly, D.J. Economou, P. Ruchhoeft, University of Houston
11:20am PS1+NS-WeM11
High Aspect Ratio Deep Trench Chamber and Process Development for Silicon Etch in DRAM Applications below 50 nm
S. Wege, S. Barth, Qimonda Dresden, Germany, A. Kersch, Qimonda Munich, Germany, M. Reinicke, Dresden University of Technology, Germany, G. Wenig, Qimonda Munich, Germany, M. Rudolph, J. Sobe, A. Steinbach, Qimonda Dresden, Germany
11:40am PS1+NS-WeM12
Etch Selectivity and Surface Roughening of Polystyrene and Poly(methyl methacrylate) in Plasma Etching of Block Copolymers
Y.-H. Ting, S.-M. Park, C.-C. Liu, X. Liu, F.J. Himpsel, P.F. Nealey, A.E. Wendt, University of Wisconsin-Madison
12:00pm PS1+NS-WeM13
Comparison between NF3 and CF4 Chemistries for the Selective Etching of SiGe Sacrificial Layers in a 300mm Chemical Dry Etching Reactor
S. Borel, CEA-Leti MINATEC, France, C. Arvet, STMicroelectronics, D. Watanabe, Shibaura Mechatronics Corporation, Japan