|AVS 54th International Symposium|
|Plasma Science and Technology||Wednesday Sessions|
|Session:||Plasmas in Nanotechnology|
|Presenter:||A.R. Waite, University of Dayton, Air Force Research Laboratory and UTC, Inc.|
|Authors:||A.R. Waite, University of Dayton, Air Force Research Laboratory and UTC, Inc.
P.T. Murray, University of Dayton
J.G. Jones, Air Force Research Laboratory
E. Shin, University of Dayton
A.A. Voevodin, Air Force Research Laboratory
|Correspondent:||Click to Email|
Nanoparticles of Fe have been formed by the process of Through Thin Film Ablation (TTFA). In the TTFA process, the target consists of a thin film (10-20 nm thick) of material that has been applied to an optically transparent support. The thin film target is ablated in vacuum through the transparent support, and this produces a directional plume of nanoparticles. Optical Emission Spectroscopy (OES), Time-of-Flight (TOF) analysis, and high-speed Intensified Charge Coupled Device (ICCD) imaging are utilized to study the plume dynamics and characteristics. OES measurements indicate the ejected nanoparticles to have a temperature of 2232 K, suggesting they are liquid. TOF analysis indicated that there are two main size constituents in the ablation plume, higher speed atomic species and slower nanoparticles. ICCD imaging is used to further study the plume dynamics in both time and space. Ablation in vacuum and in the presence of a background gas will be discussed.