AVS 66th International Symposium & Exhibition
    Thin Films Division Wednesday Sessions

Session TF+EM-WeA
Emerging Thin Film Materials: Ultra-wide Bandgap and Phase Change Materials

Wednesday, October 23, 2019, 2:20 pm, Room A122-123
Moderators: Cary Pint, Vanderbilt University, Brent Sperling, National Institute of Standards and Technology (NIST), Jin-Seong Park, Hanyang University, Korea


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:20pm TF+EM-WeA1
MOCVD Growth and Characterization of ZnGeN2-GaN Alloy Films
Benthara Hewage Dinushi Jayatunga, K. Kash, Case Western Reserve University, M.D. Reza, H. Zhao, The Ohio State University, O. Ohanaka, R. Lalk, Case Western Reserve University, M. Zhu, J. Hwang, The Ohio State University
2:40pm TF+EM-WeA2
Device Quality β-Ga2O3 and Related Alloys by MOCVD
A. Osinsky, Fikadu Alema, Agnitron Technology, Inc., Y. Zhang, A. Mauze, J.S. Speck, University of California, Santa Barbara, P. Mukhopadhyay, W. Schoenfeld, University of Central Florida
3:00pm TF+EM-WeA3 Invited Paper
Development of the β-(AlxGa1-x)2O3/β-Ga2O3 (010) Heterostructures by Plasma-assisted Molecular Beam Epitaxy
James Speck, University of California at Santa Barbara
4:20pm TF+EM-WeA7 Invited Paper
Phase-Change Memory: A Quest from Material Engineering Towards the Device Performances
Guillaume Bourgeois, G. Navarro, M.C. Cyrille, J. Garrione, C. Sabbione, M. Bernard, E. Nolot, E. Nowak, CEA-LETI, France
5:00pm TF+EM-WeA9
Neuromorphic Materials and Architectures for Dynamic Learning and Edge Processing Applications
Angel Yanguas-Gil, Argonne National Laboratory
5:20pm TF+EM-WeA10
Atomic Layer Deposited VO2 Thin Films Towards Modulated Infrared Optoelectronic Devices
Virginia Wheeler, C.T. Ellis, M. Currie, J.R. Avila, M.A. Meeker, A.J. Giles, U.S. Naval Research Laboratory, J.D. Caldwell, Vanderbilt University, J.G. Tischler, U.S. Naval Research Laboratory
5:40pm TF+EM-WeA11
Deposition Process for Vanadium Dioxide Thin Films for RF Applications
Mark Lust, S. Chen, N. Ghalichechian, The Ohio State University