AVS 66th International Symposium & Exhibition
    Thin Films Division Wednesday Sessions
       Session TF+EM-WeA

Paper TF+EM-WeA9
Neuromorphic Materials and Architectures for Dynamic Learning and Edge Processing Applications

Wednesday, October 23, 2019, 5:00 pm, Room A122-123

Session: Emerging Thin Film Materials: Ultra-wide Bandgap and Phase Change Materials
Presenter: Angel Yanguas-Gil, Argonne National Laboratory
Correspondent: Click to Email

The ability to dynamically learn and adapt to changes in the environment is one of the hallmarks of biological systems. In the last years there has been a lot of research focused on exploring novel materials, such as those exhibiting memristive behavior, that could enable this type of systems. However, there are comparatively fewer studies focusing on understanding which are the ideal properties that memristive materials should have in order to optimize the performance of architectures capable of dynamic learning. This type of information is crucial to provide design targets for new materials and accelerate the integration of novel devices into architectures optimized for specific applications.

In this work, we identify the subset of the design space of memristive materials that is optimal for dynamic learning applications: in this type of application, a system, in this case a neural network, evolves dynamically and learns as it processes information in real time. This type of behavior is highly desirable for smart sensors or edge processing applications. We have implemented a benchmark architecture consisting of a discrete implementation of spiking neurons where dynamic learning takes place on a set of plastic synapses formed by memristor pairs in a crossbar array. This architecture, which is inspired on the learning center of the insect brain, is capable of dynamically learning standard machine learning datasets such as MNIST and Fashion-MNIST. We have used this model to identify the key properties that memristive materials should have to be optimal dynamic learners, exploring the impact of the kinetics of the memristor's internal state on the system's learning ability, as well as the impact that materials and device variability and errors in tuning the memristor's internal state have on the system's performance.

The results obtained show that a fine degree of control of the memristor internal state is key to achieve high classification accuracy during dynamic learning, but that, within this optimal region, learning is extremely robust to both device variability and to errors in the writing of the internal state, in all cases allowing for 2σ variations greater than 40% without significant loss of accuracy. Moreover, the dynamics of the internal state can show distinct kinetics depending on the polarity, something that is critical for bipolar memristors. These criteria are significantly different from those required for ReRAM applications or even for neuromorphic applications based on offchip training, where the robustness of reading and writing operations are critical.