AVS 66th International Symposium & Exhibition | |
Advanced Ion Microscopy and Ion Beam Nano-engineering Focus Topic | Thursday Sessions |
Session HI-ThP |
Session: | Advanced Ion Microscopy Poster Session |
Presenter: | Xiaomo Xu, Helmholtz Zentrum Dresden-Rossendorf, Germany |
Authors: | X. Xu, Helmholtz Zentrum Dresden-Rossendorf, Germany K.-H. Heinig, Helmholtz Zentrum Dresden-Rossendorf, Germany W. Möller, Helmholtz-Zentrum Dresden-Rossendorf, Germany H.-J. Engelmann, Helmholtz Zentrum Dresden-Rossendorf, Germany N. Klingner, Helmholtz Zentrum Dresden-Rossendorf, Germany A. Gharbi, CEA-LETI, France R. Tiron, CEA-LETI, France J. von Borany, Helmholtz Zentrum Dresden-Rossendorf, Germany G. Hlawacek, Helmholtz-Zentrum Dresden Rossendorf, Germany |
Correspondent: | Click to Email |
This work is supported by the European Union’s H-2020 research project ‘IONS4SET’ under Grant Agreement No. 688072.