| AVS 66th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 5:00pm | EL-ThA9 Far-infrared Dielectric Functions of Hg1-xCdxSe Thin Films Determined via Ellipsometry and Reflectivity Frank Peiris, J. Lyons, Kenyon College, G. Brill, U.S. Army Research Laboratory |
| 5:20pm | EL-ThA10 Tunable Giant Circular Dichroism in Spatially-coherent Si-Au/Ag Nano-plasmonic Chiral Heterostructures Ufuk Kilic, M. Hilfiker, University of Nebraska-Lincoln, R. Feder, The Fraunhofer Institute for Microstructure of Materials and Systems (IMWS), Germany, R. Korlacki, E. Schubert, C. Argyropoulos, M. Schubert, University of Nebraska-Lincoln |
| 5:40pm | EL-ThA11 Numerical Ellipsometry: Methods for Selecting Measurements and Techniques for Advanced Analysis Applied to β -Gallium Oxide Frank Urban, Florida International University, D. Barton, retired, M. Schubert, University of Nebraska-Lincoln |