AVS 66th International Symposium & Exhibition | |
Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Session EL-ThA |
Session: | Spectroscopic Ellipsometry Late News Session |
Presenter: | Frank Urban, Florida International University |
Authors: | F.K. Urban, Florida International University D. Barton, retired M. Schubert, University of Nebraska-Lincoln |
Correspondent: | Click to Email |
Ellipsometry is an optical technique through which properties of materials may be determined from measurements of light reflecting from or transmitting through a sample. Usually the measurements require data processing and a key issue is determining which measurements to make. Previously two of us (Urban and Barton)[1] have addressed this for orthorhombic, anisotropic films on substrates and here we treat the case of reflection from a single anisotropic, monoclinic β-Ga2O3 crystal which is non-depolarizing and has a smooth, flat surface. Prior work on Ga2O3 by one author (Schubert)[2] used a very large dataset containing measurements at each wavenumber for three angles of incidence and 5 azimuth angles for each of 2 crystal orientations. Step 1 in that process was to determine the best-fit permittivity tensor, ε, using Levenberg-Marquardt least squares regression. Here we present methods to determine practically the same ε using a substantially reduced subset of the same data. We exclude measurements which are less useful due to large instrument-reported estimated experimental errors (σ), noise (low intensity), and mathematical insensitivity to the desired solutions. From 10 to 30 numerical solutions to the model equations are found at each wavenumber using the reduced data set as these allow an analysis of measurement accuracy. Solutions are found using each crystal independently. The number of measurements is reduced by a factor of 25 or so depending on the options selected with further reductions expected in future works. Examples using two β-Ga2O3 crystals, (010) and (-201) are presented.
1. F.K. Urban III and D. Barton, Thin Solid Films, 663, pp 116-1251, (2018)
2. M. Schubert, R. Korlacki, S. Knight, T. Hofmann, S. Schöche, V. Darakchieva, E. Janzén, B. Monemar, D. Gogova, Q.-T. Thieu et al., Phys.Rev.B 93, 125209 (2016).