| AVS 66th International Symposium & Exhibition | |
| Applied Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | AS-ThM1 Invited Paper What Really Lies Beneath the AVS Surface? Depth Profiling Can Help Provide the Answer Fred Stevie, C. Zhou, R. Garcia, North Carolina State University |
| 8:40am | AS-ThM3 TOF-SIMS Tandem MS Imaging of (Sub-)Monolayer Coatings for Device Processing David M. Carr, G.L. Fisher, Physical Electronics |
| 9:00am | AS-ThM4 TOF-SIMS at the Edge Alan Spool, D. Bilich, Western Digital Corporation |
| 9:20am | AS-ThM5 Variation of SIMS Secondary Ion Yield of Si and Mg Dopants in GaN Grown by MOCVD M. K. Indika Senevirathna, Clark Atlanta University, A.Y. Kozhanov, M. Vernon, G.B. Cross, Georgia State University, G. Cooke, Hiden Analytical Ltd, UK, M.D. Williams, Clark Atlanta University |
| 11:00am | AS-ThM10 Probing the Surface Structure of Au-Pt Core-Shell Nanoparticles C. Engelbrekt, Ich Tran, M. Law, University of California, Irvine |
| 11:20am | AS-ThM11 Correlating Multiple Data Streams for Valence State Identification in Transition Metal Oxide during XPS Depth Profiling Zhenzhong Yang, C. Wang, M.H. Engelhard, Z.H. Zhu, Y. Du, Pacific Northwest National Laboratory |
| 11:40am | AS-ThM12 Using Atom Probe Tomography for Three-dimensional Visualization of Sb Segregation in InAs/InAsSb Superlattices Nicole Kotulak, J.A. Nolde, M.E. Twigg, K.E. Knipling, U.S. Naval Research Laboratory, D. Lubyshev, J.M. Fastenau, A.W.K. Liu, IQE Inc., E. Aifer, U.S. Naval Research Laboratory |
| 12:00pm | AS-ThM13 Multi-technique Surface Analysis of Graphenes Kateryna Artyushkova, Physical Electronics and University of New Mexico, B.W. Schmidt, J.E. Mann, A.A. Ellsworth, J.G. Newman, Physical Electronics |