AVS 66th International Symposium & Exhibition
    Applied Surface Science Division Wednesday Sessions

Session AS+CA+LS-WeA
Operando Characterization Techniques for In situ Surface Analysis of Energy Devices

Wednesday, October 23, 2019, 2:20 pm, Room A211
Moderator: Svitlana Pylypenko, Colorado School of Mines


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:20pm AS+CA+LS-WeA1 Invited Paper
Probing the Electronic Structure of Electrocatalysts and the Formation of Reaction Intermediates
Kelsey Stoerzinger, Oregon State University
3:00pm AS+CA+LS-WeA3
Surface Characterization of Battery Electrode/Electrolyte Materials Using XPS and ToF-SIMS
Elisa Harrison, S. Peczonczyk, S. Simko, Ford Motor Company, K. Wujcik, Blue Current, A. Sharafi, A. Drews, Ford Motor Company
3:20pm AS+CA+LS-WeA4
In Operando Molecular Imaging of Microbes as an Electrode
Xiao-Ying Yu, Pacific Northwest National Laboratory
4:20pm AS+CA+LS-WeA7 Invited Paper
Operando-XPS Investigation of Low-Volatile Liquids and Their Interfaces using Lab-Based Instruments
Sefik Suzer, Bilkent University, Turkey
5:00pm AS+CA+LS-WeA9
Decoupling Surface and Interface Evolution in Polymer Electrolyte Membrane Systems Through In Situ X-Ray Photoelectron Spectroscopy
Michael Dzara, Colorado School of Mines, K. Artyushkova, Physical Electronics, H. Eskandari, K. Karan, University of Calgary, Canada, K.C. Neyerlin, National Renewable Energy Laboratory, S. Pylypenko, Colorado School of Mines
5:20pm AS+CA+LS-WeA10
Low Temperature Scanning Tunneling Microscopy and Spectroscopy of Semiconductor Nanowire Device Surfaces
Yen-Po Liu, Y. Liu, S.F. Mousavi, L. Sodergren, F. Lindelöw, S. Lehmann, K.A. Dick Thelander, E. Lind, R. Timm, A. Mikkelsen, Lund University, Sweden
5:40pm AS+CA+LS-WeA11
In-situ X-ray Photoelectron Spectroscopic Study of III-V Semiconductor/H2O Interfaces under Light Illumination
Pitambar Sapkota, S. Ptasinska, University of Notre Dame