AVS 66th International Symposium & Exhibition
    Applied Surface Science Division Wednesday Sessions
       Session AS+CA+LS-WeA

Paper AS+CA+LS-WeA11
In-situ X-ray Photoelectron Spectroscopic Study of III-V Semiconductor/H2O Interfaces under Light Illumination

Wednesday, October 23, 2019, 5:40 pm, Room A211

Session: Operando Characterization Techniques for In situ Surface Analysis of Energy Devices
Presenter: Pitambar Sapkota, University of Notre Dame
Authors: P.S. Sapkota, University of Notre Dame
S. Ptasinska, University of Notre Dame
Correspondent: Click to Email

A number of studies on different semiconductor materials that can be used as a photoelectrode in photoelectron-chemical (PEC) cells for solar water splitting is continually growing in material sciences and solar energy communities. III-V based compounds have been the most promising candidates because of their efficient light and carrier management properties in addition to suitable band gap and band edge energies, which properly match the solar spectrum and water redox potentials, respectively. Although most of the highly efficient PEC water splitting cells are based on III-V semiconductor, these photoelectrode materials are unstable under operational conditions. Few studies suggest oxidation leading to corrosion as a major cause of the degradation of these photoelectrodes, but it is still not completely understood and little is known about the role of the oxides formed at the interfaces. Therefore, knowledge of the interfacial reactions in realistic situations and surface dynamics are necessary to advance our understanding of water splitting mechanism, as well as to build a stable and efficient PEC solar water splitting cell. In this study, we used state of the art spectroscopic technique, ambient pressure X-ray photoelectron spectroscopy, to characterize semiconductor (GaAs and GaP) surface and to study chemical reactions occurring at the water interface in presence of secondary light source. Core level photoemission spectra from Ga2p, As3d, P2p, and O1s were collected at different water pressures in presence of secondary light source to identify the newly formed surface species, particularly oxides, and to evaluate the interaction of GaAs and GaP with water under light illumination.

This research is based upon work supported by the U.S. Department of Energy Office of Science, Office of Basic Energy Sciences under Award Number DE-FC02-04ER15533.