AVS 66th International Symposium & Exhibition
    Applied Surface Science Division Tuesday Sessions

Session AS+BI+RA-TuM
Quantitative Surface Analysis III/Other Surface Analysis Methods

Tuesday, October 22, 2019, 8:00 am, Room A211
Moderator: Karen Gaskell, University of Maryland, College Park


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  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am AS+BI+RA-TuM1 Invited Paper
Oxygen Energy Filtering and Relative Sensitivity Factor Considerations for Making U and Pu Measurements by LG-SIMS
Todd Williamson, Los Alamos National Laboratory
8:40am AS+BI+RA-TuM3
Utilizing Large Geometry Secondary Ion Mass Spectrometry for Age-Dating of Individual Uranium Particles
Christopher Szakal, D.S. Simons, J.D. Fassett, National Institute of Standards and Technology (NIST), A.J. Fahey, Corning Inc.
9:00am AS+BI+RA-TuM4
Peak Shape Analysis in TOF SIMS: Best Practices and Limiting Precision in Accounting for Detector Saturation
Lev Gelb, A.V. Walker, University of Texas at Dallas
9:20am AS+BI+RA-TuM5
Electronic Structure and Band Gaps of Industrially Relevant Materials Investigated by Photoelectron Spectroscopy and REELS (Reflection Electron Energy Loss Spectroscopy)
Paul Mack, T.S. Nunney, Thermo Fisher Scientific, UK, H.M. Meyer III, Oak Ridge National Laboratory
9:40am AS+BI+RA-TuM6
Practical References for Low Energy Ion Scattering by Ca and F
S. Průsa, T. Šikola, Brno University of Technology, Czech Republic, Hidde Brongersma, IONTOF Technologies GmbH, Germany/Eindhoven University of Technology, Eindhoven, The Netherlands, Germany
11:00am AS+BI+RA-TuM10
Extreme-Ultraviolet-Assisted Atom Probe Tomography
Norman Sanford, L. Miaja Avila, National Institute of Standards and Technology (NIST), P. Blanchard, National Institute of Sandards and Technology (NIST), D.R. Diercks, B. Gorman, Colorado School of Mines, A. Chiaramonti, National Institute of Sandards and Technology (NIST)
11:20am AS+BI+RA-TuM11
A Multi-Technique Approach for Complete Thin Film Characterisation
Sarah Coultas, J.D.P. Counsell, N. Gerrard, C.J. Blomfield, Kratos Analytical Limited, UK, C. Moffitt, Kratos Analytical Limited, T. Conard, IMEC, Belgium
11:40am AS+BI+RA-TuM12
Polymeric Barrier Coatings for Silicone Elastomer against Diffusion of Isocyanate in Vacuum Casting Processes
Martin Wortmann, R. Petkau, Bielefeld University of Applied Sciences, Germany, N. Frese, Bielefeld University, Germany, E. Moritzer, Paderborn University, Germany, A. Gölzhäuser, Bielefeld University, Germany, B. Hüsgen, Bielefeld University of Applied Sciences, Germany
12:00pm AS+BI+RA-TuM13
pARXPS Study of GeSbTe Surface Oxidation
Ludovic Goffart, ST Microelectronics/LTM/CEA-LETI, France, C. Vallée, Laboratoire des Technologies de la Microélectronique (LTM), France, B. Pelissier, LTM, Univ. Grenoble Alpes, CEA-LETI, France, J-P. Reynard, D. Benoit, ST Microelectronics, France, G. Navarro, CEA-LETI, France