| AVS 66th International Symposium & Exhibition | |
| Applied Surface Science Division | Tuesday Sessions |
| Session AS+BI+RA-TuM |
| Session: | Quantitative Surface Analysis III/Other Surface Analysis Methods |
| Presenter: | Christopher Szakal, National Institute of Standards and Technology (NIST) |
| Authors: | C. Szakal, National Institute of Standards and Technology (NIST) D.S. Simons, National Institute of Standards and Technology (NIST) J.D. Fassett, National Institute of Standards and Technology (NIST) A.J. Fahey, Corning Inc. |
| Correspondent: | Click to Email |
Secondary ion mass spectrometry (SIMS) is routinely utilized by the International Atomic Energy Agency (IAEA) and its global partner laboratories for the isotopic analysis of individual uranium particles as part of nuclear safeguards efforts. One additional isotopic analysis that has repeatedly been requested by the IAEA involves the development of a capability to perform single particle age-dating, which would provide information about the last time that the nuclear material was purified or enriched. Previously reported efforts in multiple countries have reported the ability to use SIMS and/or large geometry (LG)-SIMS for this purpose, but with the caveat that the measurement can only be viable if the particles are large enough, old enough, and/or enriched enough. We present a new methodology, complete with propagated uncertainties, that advances the individual uranium particle age-dating measurement to include smaller, younger, and lower enriched nuclear material than previously envisioned. Additionally, we will provide insights into utility of this measurement advance within the aims of global nuclear safeguards objectives.