AVS 66th International Symposium & Exhibition | |
Applied Surface Science Division | Tuesday Sessions |
Session AS+BI+RA-TuM |
Session: | Quantitative Surface Analysis III/Other Surface Analysis Methods |
Presenter: | Hidde Brongersma, IONTOF Technologies GmbH, Germany/Eindhoven University of Technology, Eindhoven, The Netherlands, Germany |
Authors: | S. Průsa, Brno University of Technology, Czech Republic T. Šikola, Brno University of Technology, Czech Republic H.H. Brongersma, IONTOF Technologies GmbH, Germany/Eindhoven University of Technology, Eindhoven, The Netherlands, Germany |
Correspondent: | Click to Email |
A complication is that the composition of the outer atomic layer of a material is generally fundamentally and radically different from that of the atoms below this surface. Thus it is unlikely that the F/Ca ratio in the outer surface of CaF2 will be 2. In fact, precisely this difference makes the LEIS information unique and complementary to that of analytic techniques such as XPS, Auger and (TOF-) SIMS which probe several to many atoms deep. The difference is also highly relevant, since the outer atoms of a surface largely control important processes as adhesion, catalysis, electron emission and growth
It will be shown how the F/Ca atomic ratio, the Ca and F atomic densities, as well as the roughness factors for CaF2 and CaCO3 have been determined.
[1] T. Gholian Avval, C.V. Cushman, P. Brüner, T. Grehl, H.H. Brongersma, M.R. Linford,
Surf. Sci. Spectra, to be published (2019)
[2] R.M. Almeida, R. Hickey, H. Jain, C.G. Pantano, J. Non-Cryst. Solids 385 (2014) 124