| AVS 66th International Symposium & Exhibition | |
| Applied Surface Science Division | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS+BI+CA+LS-TuA1 Invited Paper Nanotechnology as a Driver for Going Beyond Traditional Surface Analysis Olivier Renault, CEA-LETI, France |
| 3:00pm | AS+BI+CA+LS-TuA3 Core Levels Sub-shell Photo-ionization Cross-sections of Au, Ag, Cu in the Hard X-ray Photon Energy Range of 7-26 keV Germán Rafael Castro, J. Rubio Zuazo, Spanich CRG BM25-SpLine Beamline at the ESRF, France |
| 4:20pm | AS+BI+CA+LS-TuA7 Invited Paper Nanoscale Tomographic Mapping the Liquid-Solid Interface with Cryo-APT Daniel Perea, D.K. Schreiber, J.E. Evans, V. Ryan, Pacific Northwest National Laboratory |
| 5:00pm | AS+BI+CA+LS-TuA9 Characterization of Electronic Materials using Low Energy Inverse Photoemission Spectroscopy Benjamin Schmidt, J.G. Newman, J.E. Mann, K. Artyushkova, L. Swartz, Physical Electronics, M. Terashima, T. Miyayama, ULVAC-PHI Inc., Japan |
| 5:20pm | AS+BI+CA+LS-TuA10 Deconvolution of Atom Probe Tomography on Nanomaterials for Renewable Energy Margaret Fitzgerald, M.J. Dzara, D.R. Diercks, Colorado School of Mines, N. Leick, S.T. Christensen, National Renewable Energy Laboratory, T. Gennett, S. Pylypenko, Colorado School of Mines |
| 5:40pm | AS+BI+CA+LS-TuA11 Mass Spectrometric Investigation of Ion Solvation in Liquids, a Comparison of in situ Liquid SIMS to Regular ESI-MS Yanyan Zhang, Institute of Chemistry, Chinese Academy of Sciences, China, D.R. Baer, Z.H. Zhu, Pacific Northwest National Laboratory |
| 6:00pm | AS+BI+CA+LS-TuA12 Characterizing the Thickness and Physical Properties of Nearly Ideal Zirconium Oxide Surfaces Using Ellipsometry, ESCA, Profilometry and FIB Edward Gillman, Naval Nuclear Laboratory |