| AVS 66th International Symposium & Exhibition | |
| Thin Films Division | Thursday Sessions |
| Session TF-ThP |
| Session: | Thin Films Poster Session |
| Presenter: | Gabrielle Pasternak, Washington and Jefferson College |
| Authors: | G. Pasternak, Washington and Jefferson College A. Gardill, Lawrence University S.E. Chamberlin, Washington and Jefferson College |
| Correspondent: | Click to Email |
There is a constant search for more efficient materials for use in electronics. Zinc Oxide (ZnO) is a well-known semiconductor used in numerous applications. However, the effects of doping ZnO with chromium (Cr) are less documented. Using spray pyrolysis – a robust and industrially relevant technique – an aqueous solution of Zn and Cr nitrates is sprayed onto a heated substrate to create thin films of polycrystalline (Zn1‑xCrx)O with various Cr concentrations below x = 0.05.
X-ray diffraction (XRD) is used to verify the retention of ZnO’s structure, confirming that Cr substitutes for Zn in the crystal lattice. XRD can also give detailed information about the crystal lattice parameters and crystallite size – both important in understanding the effectiveness of our growth process. Verifying with XRD that we have grown good crystalline material is the first step to increasing the understanding of (Zn1‑xCrx)O. We have also begun to investigate the optical and chemical properties of this material.