AVS 66th International Symposium & Exhibition | |
Thin Films Division | Tuesday Sessions |
Session TF+EM+MI-TuM |
Session: | Thin Films for Microelectronics, Photonics, and Optoelectronic Applications |
Presenter: | Robyn Collette, University of Tennessee Knoxville |
Authors: | R. Collette, University of Tennessee Knoxville Y. Wu, University of Tennessee Knoxville P.D. Rack, University of Tennessee Knoxville |
Correspondent: | Click to Email |
Surface plasmon resonances can be sustained by metallic nanostructures and have been explored for potential optoelectronic device applications. Metallic alloys provide a pathway to tune the plasmonic response of a material. Additionally, alloying may allow for multifunctional materials to be realized. For example, Au-Ni alloys may combine the magnetic properties of ferromagnetic Ni with the plasmonic properties of Au. However, limited studies have been conducted on Au-Ni alloys for use in plasmonic devices. Since the behavior of the alloys depends on the structure, it is first critical to understand the relationship between the structure and the optical properties of the alloy.
In this study, the optical properties of Au1-xNix alloy thin films are investigated by employing a combinatorial sputtering approach. The dielectric function is measured using spectroscopic ellipsometry and is correlated to the composition (energy dispersive x-ray spectroscopy), and phases present (x-ray diffraction). As-deposited alloys form a metastable solid solution, however, annealed alloys exhibited phase separation into Au-rich and Ni-rich phases due to the large miscibility gap in the Au-Ni material system. The optical properties are then rationalized by modeling the dielectric function of the solid solution alloys with a Drude-Critical Point analytical model. Lastly, the efficacy of the model is demonstrated which shows that the dielectric function of the phase separated alloys may be approximated using a composition-weighted average of two solid solution dielectric functions.