AVS 65th International Symposium & Exhibition
    Plasma Science and Technology Division Thursday Sessions

Session PS-ThA
Plasma Diagnostics, Sensors and Controls

Thursday, October 25, 2018, 2:20 pm, Room 104A
Moderator: Steven Shannon, North Carolina State University


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

2:20pm PS-ThA1
In-situ Measurement of Electron Emission and Electron Reflection Yields
Mark Sobolewski, National Institute of Standards and Technology (NIST)
2:40pm PS-ThA2
Electron Energy Distribution Measurements in Dusty Non-thermal Plasmas
Austin Woodard, L. Mangolini, University of California, Riverside
3:00pm PS-ThA3 Invited Paper
The Surface Plasmon Energy and the Secondary Electron Emission on an Oxidized Aluminum Surface
J.-T. Li, J. Qiu, Yi-Kang Pu, Tsinghua University, China
4:00pm PS-ThA6
Transient Phenomena in Power Modulated Chlorine Plasma
Priyanka Arora, T. List, T. Ma, University of Houston, S. Shannon, North Carolina State University, S. Nam, Samsung Electronics Co., Ltd., Republic of Korea, V.M. Donnelly, University of Houston
4:20pm PS-ThA7
Measurements of RF Magnetic Fields and Plasma Current in Coupled Low and Very High Dual-Frequency Plasma Sources
J.P. Zhao, P.L.G. Ventzek, B. Lane, Tokyo Electron America, Inc., Toshihiko Iwao, K. Ishibashi, Tokyo Electron Technology Solutions Ltd., Japan
4:40pm PS-ThA8
Self-neutralized Nearly Monoenergetic Positive Ion Beam Extracted From a Pulsed Plasma
Ya-Ming Chen, R. Sawadichai, University of Houston, S. Tian, Lam Research Corporation, V.M. Donnelly, D.J. Economou, P. Ruchhoeft, University of Houston
5:00pm PS-ThA9
Diagnostics of Plasma Neutral Species in a Very High Frequency Oxygen Plasma with High Sensitivity Broadband Absorption Spectroscopy
Jianping Zhao, P.L.G. Ventzek, B. Lane, Tokyo Electron America, Inc., T. Iwao, K. Ishibashi, Tokyo Electron Technology Solutions Ltd., Japan, J.-P. Booth, CNRS, Ecole Polytechnique, France
5:20pm PS-ThA10
Development of the Virtual Metrology Using a Plasma Information Variable (PI-VM) for Monitoring SiO2 Etch Depth
Yunchang Jang, H.-J. Roh, S. Ryu, J.-W. Kwon, G.-H. Kim, Seoul National University, Republic of Korea
5:40pm PS-ThA11
Model Predictive Control of Plasma Density in Ar/SF6 Capacitively Coupled Plasma Source
Sangwon Ryu, H.-J. Roh, Y. Jang, D. Park, J. Koo, J.M. Lee, G.-H. Kim, Seoul National University, Republic of Korea