| AVS 65th International Symposium & Exhibition | |
| Applied Surface Science Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| AS-ThP1 Toward an Improved Understanding of the role of soil organic matter in NOy cycling through Investigation of Heterogeneous Reactions with NO2+ R. Hansen, Indiana University, Mark Engelhard, Pacific Northwest National Laboratory, J. Raff, Indiana University |
| AS-ThP2 Measuring the Damage Depth and Recovery of PEMA Thin Films using Multiple Technique Analysis William Sgammato, R.E. Simpson, Thermo Fisher Scientific, UK |
| AS-ThP3 Determination of Band Offsets in Semiconductor Heterostructures (2D/3D) by using XPS Mohamed Hedhili, King Abdullah University of Science and Technology (KAUST), Core Labs, Saudi Arabia, M. Tangi, P. Mishra, T.K. Ng, B. Janjua, C.C. Tseng, Photonics Laboratory, King Abdullah University of Science and Technology (KAUST), Saudi Arabia, D.H. Anjum, King Abdullah University of Science and Technology (KAUST), Core Labs, Saudi Arabia, M.S. Alias, Photonics Laboratory, King Abdullah University of Science and Technology (KAUST), Saudi Arabia, N. Wei, King Abdullah University of Science and Technology (KAUST), Core Labs, Saudi Arabia, L.J. Li, Physical Sciences and Engineering Division, King Abdullah University of Science and Technology (KAUST), Saudi Arabia, B.S. Ooi, Photonics Laboratory, King Abdullah University of Science and Technology (KAUST), Saudi Arabia |
| AS-ThP4 Multi-technique Characterization of Nanowire-based Catalysts and Electrodes Sarah Zaccarine, C. Ngo, Colorado School of Mines, S. Shulda, S. Mauger, S.M. Alia, K.C. Neyerlin, B.S. Pivovar, National Renewable Energy Laboratory, S. Pylypenko, Colorado School of Mines |
| AS-ThP6 Characterization of Laser-Treated Ti-6Al-4V-Surfaces Harry Meyer, D. Leonard, A. Sabau, Oak Ridge National Laboratory |
| AS-ThP7 Cross-Sectional Mapping vs. Depth Profiling Analysis: Is the Choice Always Clear? Kathryn Lloyd, J.R. Marsh, DuPont Corporate Center for Analytical Sciences |
| AS-ThP8 Investigation on Human Evidences using ToF-SIMS Combined with Advanced Matching Recognition T. Terlier, Korea Institute of Science and Technology, J. Lee, M. Kang, Yeonhee Lee, Korea Institute of Science and Technology, Republic of Korea |
| AS-ThP10 Wafer Bonding Between LiTaO3(100) and Alpha-quartz SiO2(100) via Low Temperature (<220°C) NanoBonding™ Using Surface Energy Modification Brian Baker, J. Kintz, A. Yano, N. Herbots, Arizona State University, W.-L. Lee, Cactus Materials, Inc., S.R. Narayan, J.M. Day, Arizona State University, R. Islam, Cactus Materials, Inc., Y. Watznabe, TDC Coporation, M. Koury, M. Johnson, R.J. Culbertson, M. Magnus, Arizona State University |
| AS-ThP11 Structural, Morphological and Electrical Properties of Multilayer Sequentially Sputtered Nb3Sn Films for Different Layer Thicknesses Md. Nizam Sayeed, Old Dominion University, U. Pudasaini, College of William and Mary, H. E. Elsayed-Ali, Old Dominion University, G. Eremeev, Thomas Jefferson National Accelerator Facility |