| AVS 65th International Symposium & Exhibition | |
| Applied Surface Science Division | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS+SE-WeA1 Identification of Unknown Contaminants in Industrial Applications Using MS/MS in Combination with High Resolution Mass Spectrometry A. Pirkl, Julia Zakel, D. Rading, IONTOF GmbH, Germany, N.J. Havercroft, IONTOF USA, S. Kayser, H. Arlinghaus, R. Moellers, E. Niehuis, IONTOF GmbH, Germany |
| 2:40pm | AS+SE-WeA2 ToF-SIMS Analysis of Glass and Glass Coatings Christine Mahoney, Corning Inc. |
| 3:00pm | AS+SE-WeA3 Invited Paper Problem Solving with Valence Band Spectroscopy and SIMS MS/MS Steven Pachuta, D.M. Poirier, 3M Company |
| 4:20pm | AS+SE-WeA7 Surface and In-depth XPS Characterization of Liquid and Cured Control Release Additives (CRAs) Used in Silicone-Based Release Coatings Brian Strohmeier, K. Rhodes, R. Munigeti, J. Orlowski, Avery Dennison Corporation |
| 4:40pm | AS+SE-WeA8 Differentiating Silicones Using SIMS Paul Vlasak, M.L. Pacholski, The Dow Chemical Company |
| 5:00pm | AS+SE-WeA9 Uranium Particles Analysis and Imaging Using ToF-SIMS for Source Identification Juan Yao, E. Krogstad, S. Shen, Z.H. Zhu, X-Y. Yu, Pacific Northwest National Laboratory |
| 5:40pm | AS+SE-WeA11 Application of X-ray Photoelectron Spectroscopy to Degradation Studies of Electrodes in Fuel Cells and Electrolyzers Kateryna Artyushkova, University of New Mexico, N. Danilovic, Lawrence Berkeley Lab, University of California, Berkeley, C. Capuano, Proton on site, A. Serov, Pajarito Powder LLC, P. Atanassov, University of New Mexico |