| AVS 65th International Symposium & Exhibition | |
| Applied Surface Science Division | Wednesday Sessions |
| Session AS+SE-WeA |
| Session: | Industrial and Practical Applications of Surface Analysis |
| Presenter: | Paul Vlasak, The Dow Chemical Company |
| Authors: | P.R. Vlasak, The Dow Chemical Company M.L. Pacholski, The Dow Chemical Company |
| Correspondent: | Click to Email |
The unique properties of poly(dimethylsiloxane), also known as PDMS or silicone, have allowed PDMS-based materials to proliferate in modern industry. A huge variety of applications using PDMS have been developed including structural adhesives, release agents, optical components, lubricants, anti-foam agents, and potting agents to name a few. Considering the omnipresence of PDMS in industrial settings along with its low surface energy and tendency to migrate, it comes as no surprise that PDMS is frequently encountered in industrial surface analysis laboratories. Because PDMS is readily detected and easily recognized by its characteristic fragmentation pattern, SIMS is well suited to identifying the presence of silicones on a wide range of materials.
In some instances, the analyst expects to find PDMS on a sample surface. For example, the PDMS transferred from a silicone release liner onto an adhesive may be of interest. In other instances, PDMS can be encountered as an unexpected contaminant, perhaps interfering with adhesion or causing defects in a coating or painting operation. In either case, besides its mere presence, the structural details of the PDMS may be important to understanding the behavior of the adhesive/release system or discovering the actual source of a contaminant amongst multiple possibilities.
From a pragmatic standpoint, the current work explores how molecular weight, endgroup type, and other structural factors influence PDMS fragmentation patterns through the use of well-characterized reference materials. The effects of instrument-related parameters as well as film thickness and substrate type will also be considered to the extent these factors influence the spectra obtained.