AVS 65th International Symposium & Exhibition
    Applied Surface Science Division Wednesday Sessions
       Session AS+SE-WeA

Paper AS+SE-WeA7
Surface and In-depth XPS Characterization of Liquid and Cured Control Release Additives (CRAs) Used in Silicone-Based Release Coatings

Wednesday, October 24, 2018, 4:20 pm, Room 204

Session: Industrial and Practical Applications of Surface Analysis
Presenter: Brian Strohmeier, Avery Dennison Corporation
Authors: B. Strohmeier, Avery Dennison Corporation
K. Rhodes, Avery Dennison Corporation
R. Munigeti, Avery Dennison Corporation
J. Orlowski, Avery Dennison Corporation
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Silicone-based release coatings are used in a wide variety of commercial applications including: release liners for removable pressure sensitive adhesive laminates and tapes, release papers and polymer films, non-stick packaging, and other products where a specific force of peel separation is required between two different film materials during processing or storage. Typical industrial silicone-based release coatings consist of UV or heat cured mixtures of silicone compounds and controlled release additives (CRAs). CRAs commonly contain proprietary mixtures of functionalized silanes, siloxanes, and silica, plus a variety of other organic components. The release properties of silicone-based release coatings depend highly on the distinct types and relative amounts of the silicone compounds and CRAs used in the cured mixture. Therefore, it is of great interest to quantitatively characterize the silicone and CRA components on the surface of silicone release coatings for improved product and process development as well as problem-solving related to release issues. In this study, a variety of commercial CRA products were characterized by gel permeation chromatography (GPC) for bulk molecular weight distribution information and by X-ray photoelectron spectroscopy (XPS) for surface composition and chemistry. The CRA materials studied had vapor pressures that allowed successful XPS characterization in the liquid state. Surprisingly, the CRA liquids could even be sputtered and/or depth profiled using argon cluster ions, whereas sputtering with monatomic argon ions resulted in XPS chemical state changes caused by ion beam induced sample damage. The CRA materials were characterized by XPS and argon cluster ion sputtering/depth profiling in the pure liquid state and in solid heat cured release coating mixtures with polydimethyl siloxane (PDMS). The high resolution Si 2p XPS spectra obtained for cured silicone release coatings of known composition could be peak-fitted into separate CRA and PDMS components to produce a quantitative calibration curve for evaluating release coatings with unknown CRA/silicone compositions.