| AVS 65th International Symposium & Exhibition | |
| Advanced Ion Microscopy Focus Topic | Thursday Sessions |
| Session HI+AS-ThM |
| Session: | Advanced Ion Microscopy & Surface Analysis |
| Presenter: | Tahereh Gholian Avval, Brigham Young University |
| Authors: | M.R. Linford, Brigham Young University T.G. Avval, Brigham Young University H.H. Brongersma, IONTOF GmbH, Germany T. Grehl, IONTOF GmbH, Germany |
| Correspondent: | Click to Email |
Historically, Surface Science Spectra (SSS) has been an important archive for X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and time-of-flight secondary ion mass spectrometry (ToF-SIMS) data; this detailed, peer-reviewed database now consists of thousands of submissions and spectra that represent these techniques. Thus, SSS has been and continues to be a valuable resource to the surface community. Recently, SSS has begun to expand the surface/material techniques it covers. For example, it now accepts spectroscopic ellipsometry submissions on the optical properties of materials. It is anticipated that submissions in this area will slowly increase so that SSS will become a valuable source of information in this area as well.
In this presentation we discuss the development of an SSS submission form for low energy ion scattering (LEIS). Fields in the form that will be discussed include the abstract, introduction, data, and conclusions. In an SSS submission, the provenance of the sample is carefully documented. A detailed description is also required of the equipment used and of all of its relevant operating parameters – the nature of its beams, the beam energies, the analyzer geometry, etc. The original data collected by the submitter must be supplied, and representative examples of it must be plotted.
Finally, we will show sample submissions based on this new form that should have been submitted for publication by AVS 2018. These will include LEIS submissions of CaF2, SrO, and Al2O3 reference materials