| AVS 65th International Symposium & Exhibition | |
| Advanced Ion Microscopy Focus Topic | Thursday Sessions |
| Session HI+AS-ThM |
| Session: | Advanced Ion Microscopy & Surface Analysis |
| Presenter: | André Beyer, Bielefeld University, Germany |
| Authors: | A. Beyer, Bielefeld University, Germany D. Emmrich, Bielefeld University, Germany M. Salamanca, Bielefeld University, Germany L. Ruwe, Bielefeld University, Germany H. Vieker, Bielefeld University, Germany K. Kohse-Höinghaus, Bielefeld University, Germany A. Gölzhäuser, Bielefeld University, Germany |
| Correspondent: | Click to Email |
Complementary techniques for the characterization of soot particles are needed to gain insight into their formation processes. In this contribution, we focus on Helium Ion Microscopy (HIM) which allows high contrast imaging of soot particles with sizes down to 2 nm. Soot formation was realized with well-defined model flames from different fuel compositions. The particles were sampled on silicon substrates at different positons within the flame which allows choosing the particles degree of maturity. Large numbers of particles were recorded with a single HIM image in a relatively short time. A number of such images were combined to obtain meaningful particle size distributions. In addition, the following geometric properties of soot particles were evaluated: sphericity, circularity, and fractal dimension. Comparison with other experimental techniques as well as theoretical model calculations demonstrate the strength of the HIM characterization method [1-3].
[1] M. Schenk et al., ChemPhysChem 14, 3248 (2013).
[2] M. Schenk et al., Proc. Combust. Inst. 35, 1879 (2015).
[3] C. Betrancourt et al., Aerosol Science and Technology 51, 916 (2017).