| AVS 65th International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Monday Sessions |
| Session EL+EM-MoA |
| Session: | Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches |
| Presenter: | Mathias Schubert, University of Nebraska - Lincoln, Linköping University, Sweden, Leibniz Institute for Polymer Research, Dresden, Germany |
| Authors: | M. Schubert, University of Nebraska - Lincoln, Linköping University, Sweden, Leibniz Institute for Polymer Research, Dresden, Germany A. Mock, University of Nebraska - Lincoln R. Korlacki, University of Nebraska - Lincoln S. Knight, University of Nebraska - Lincoln V. Darakchieva, Linköping University, Sweden B. Monemar, Linköping University, Sweden, Tokyo University of Agriculture and Tech., Japan H. Murakami, Tokyo University of Agriculture and Technology, Japan Y. Kumagai, Tokyo University of Agriculture and Technology, Japan K. Goto, Tokyo University of Agriculture and Technology, Tamura Corporation, Japan M. Higashiwaki, National Institute of Information and Communications Technology, Japan |
| Correspondent: | Click to Email |
We discuss analysis of the dielectric function tensor for monoclinic metal oxides. We derive the dispersions of transverse, longitudinal and plasmon coupled modes in gallium oxide [M. Schubert et al., Phys. Rev. B 93, 125209 (1-18) (2016); Editors’ Suggestion], the Lyddane-Sachs-Teller relation for monoclinic and triclinic semiconductors [M. Schubert, Phys. Rev. Lett. 117, 215502 (2016)], the identification of transverse and longitudinal phonons in scintillator material cadmium tungstate [A. Mock, M. Schubert et al., Phys. Rev. B 95, 165202 (1-15) (2017)], the band-to-band transitions and excitons and their eigenvectors in gallia [A. Mock, M. Schubert et al., Phys. Rev. B 96, 245205 (1-12) (2017)], the effective electron mass tensor measurement using the optical Hall effect in gallium oxide [S. Knight, A. Mock, M. Schubert et al., Appl. Phys. Lett. 112, 012103 (2018); Editors’ Pick], the temperature dependence of band-to-band transitions energies in gallium oxide [A. Mock, M. Schubert et al., Appl. Phys. Lett. 112, 041905 (2018)], and the dielectric and inverse dielectric tensor analysis method for transverse and longitudinal phonon mode dispersion characterization in high-power laser material yttrium silicon oxide [A. Mock, M. Schubert et al., Phys. Rev. B, 97 165203 (1-17) (2018)].