AVS 65th International Symposium & Exhibition
    Spectroscopic Ellipsometry Focus Topic Monday Sessions
       Session EL+AS+EM-MoM

Paper EL+AS+EM-MoM4
Temperature Dependent Dielectric Function and Critical Point Comparison of bulk Ge and α-Sn on InSb

Monday, October 22, 2018, 9:20 am, Room 202A

Session: Application of SE for the Characterization of Thin Films and Nanostructures
Presenter: Rigo Carrasco, New Mexico State University
Authors: R. Carrasco, New Mexico State University
C. Emminger, New Mexico State University
N. Samarasingha, New Mexico State University
F. Abadizaman, New Mexico State University
S. Zollner, New Mexico State University
Correspondent: Click to Email

Germanium is an indirect bandgap semiconductor with a bandgap of 1.55 µm at room temperature. Its band gap can be shifted to longer wavelengths and becomes direct by adding 5-20% Sn, which allows to detect efficiently in the IR range. Alloys of Ge and Sn are therefore of interest for photovoltaics, detectors and room temperature lasers (2-7 µm). Alpha-tin on the other hand, is a semimetal that, when under strain, has a very small band gap at the Gamma point of the Brillouin zone. We compare this direct band gap (E0 peak) occurring in the infrared region of strained α-Sn on InSb to the absorption edge of Ge.

We investigate the temperature dependence of the complex dielectric function (DF) and interband critical points (CPs) of bulk Ge between 10 and 738 K using spectroscopic ellipsometry in the spectral range from 0.5 to 6.3 eV at a 70° angle of incidence [1]. The complex dielectric function at each temperature is fitted using a parametric oscillator model. Figure 1 shows that variations in temperature influence structures in the spectra of the DF. Furthermore, we analyze CPs in reciprocal space by studying Fourier coefficients as described in [2]. The peaks of the E0 and E00 CPs are relatively narrow (Fig. 2) which makes the analysis of their broadenings difficult. A small excitonic peak is visible at the absorption edge E0, also shown in Fig. 2.

Spectroscopic ellipsometry measurements were also performed on several epitaxially grown α-Sn layers on InSb in the spectral range of 0.03 to 6.5 eV. Comparing the results of the pseudo-dielectric function of Sn to the one of Ge shows a remarkable difference of both spectra in the IR- region, as demonstrated in Fig. 3. While structures at higher energies, such as the E1 and E11 CPs, are similar in shape and amplitude for both materials, the E0-peak in α-Sn is significantly larger than in Ge. Therefore, we believe that the E0 peak in the spectrum of Sn is not due to excitons but can probably be explained by other parameters which influence the band structure, such as strain, composition, or free carrier concentration. The large peak between E0 and E1 is an interference fringe. We also compare the temperature dependence of the E0 gap in Ge and alpha-tin.

This work was supported by the National Science Foundation (DMR-1505172) and by the Army Research Office (W911NF-14-1-0072). C. Emminger gratefully acknowledges support from the Marshallplan-Jubiläumsstiftung.

References

[1] C. Emminger, MS thesis (Johannes Kepler University, Linz, Austria).

[2] S. D. Yoo and D. E. Aspnes. J. Appl. Phys. 89, 8183 (2001).