AVS 65th International Symposium & Exhibition | |
Spectroscopic Ellipsometry Focus Topic | Monday Sessions |
Session EL+AS+EM-MoM |
Session: | Application of SE for the Characterization of Thin Films and Nanostructures |
Presenter: | Serang Park, University of North Carolina at Charlotte |
Authors: | D.B. Fullager, University of North Carolina at Charlotte S. Park, University of North Carolina at Charlotte Y. Li, University of North Carolina at Charlotte J. Reese, University of North Carolina at Charlotte E. Sharma, Harris Corporation S. Lee, Harris Corporation S. Schӧche, J.A. Woollam Co. Inc C.M. Herzinger, J.A. Woollam Co. Inc G.D. Boreman, University of North Carolina at Charlotte T. Hofmann, University of North Carolina at Charlotte |
Correspondent: | Click to Email |