| 8:00am |
SP+SS+TF-WeM1 Invited Paper
Local Probe Investigation of 1D Structures and Interfaces in 2D Materials
Chenggang Tao, Virginia Tech |
| 8:40am |
SP+SS+TF-WeM3
Investigation of Electronic Structures from Monolayers to Multilayers in Charge Transfer Complex, TTF-TCNQ using Low-temperature Scanning Tunneling Microscopy/Spectroscopy
Seokmin Jeon, P. Maksymovych, Oak Ridge National Laboratory |
| 9:00am |
SP+SS+TF-WeM4
Investigation of Initial Stages of Oxidation of Ni-Cr and Ni-Cr-Mo Alloys by Scanning Tunneling Microscropy/Spectroscopy (STM/STS)
Gopalakrishnan Ramalingam, P. Reinke, University of Virginia |
| 9:20am |
SP+SS+TF-WeM5 Invited Paper
Au(111) Characterization, Single Atom Manipulation and Si(100):H Surface Imaging by LT-UHV-4 STM
Corentin Durand, D. Sordes, C. Joachim, CNRS, France |
| 11:00am |
SP+SS+TF-WeM10
Heterochiral to Homochiral Transition in Pentahelicene 2D Crystallization induced by 2nd-layer Nucleation
Anaïs Mairena, Universität Zürich, Switzerland |
| 11:20am |
SP+SS+TF-WeM11
Two-stage Chiral Selectivity in the Molecular Self-Assembly of Tryptophan
Nathan Guisinger, Argonne National Laboratory, B. Kiraly, Northwestern University, R. Rankin, Villanova University |
| 11:40am |
SP+SS+TF-WeM12
Mask Free Approach to Selective Growth of Transition Metal Dichalcogenides Heterostructures enabled with Scanning Probe based Nanolithography
R. Dong, L. Moore, N. Aripova, C. Williamson, R. Schurz, Saint Louis University, L.E. Ocola, Argonne National Laboratory, Irma Kuljanishvili, Saint Louis University |
| 12:00pm |
SP+SS+TF-WeM13
Non-Destructive Electrical Depth Profiling across Nanometric SiO2 Layers
Hagai Cohen, Weizmann Institute of Science, Israel, A. Givon, Tel Aviv University, Israel |