AVS 63rd International Symposium & Exhibition | |
Scanning Probe Microscopy Focus Topic | Wednesday Sessions |
Session SP+SS+TF-WeM |
Session: | Probing Electronic Properties |
Presenter: | Seokmin Jeon, Oak Ridge National Laboratory |
Authors: | S. Jeon, Oak Ridge National Laboratory P. Maksymovych, Oak Ridge National Laboratory |
Correspondent: | Click to Email |
Thanks to submolecular resolution STM data and DFT calculations we were able to accurately determine the stacking relationship between the overlying layer and the underlying layer at an atomic scale. In such a well-defined layered model structure, we scrutinize the electronic structures of multilayered TCNQ and TTF-TCNQ using STS. Double-periodic charge ordering and Coulomb gap features are observed in the bilayer TTF-TCNQ. The effect of substrate variation (Ag, Au, and HOPG) on multilayer growth and electronic properties are discussed. The STS data from the multiple combinations of adsorbates and substrates allow us to assign states reliably and understand of transition of the surface, molecular, and charge transfer states clearly in the multilayer systems.
This research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility.