| AVS 63rd International Symposium & Exhibition | |
| Nanometer-scale Science and Technology | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | NS-TuA1 Invited Paper Frontiers of Force Microscopy in Nanoscience and Nanotechnology Ricardo Garcia, CSIC, Spain |
| 3:00pm | NS-TuA3 Invited Paper Elemental and Magnetic Fingerprinting of Materials at the Nanoscale by Synchrotron X-ray Scanning Tunneling Microscopy Volker Rose, Argonne National Laboratory |
| 4:20pm | NS-TuA7 Invited Paper Quantitative Nanomechanics of Soft Materials with AFM: Old and New Methods Igor Sokolov, Tufts University |
| 5:00pm | NS-TuA9 AFM Based Nanoscale Structure-Property Characterization of Nanoporous Organo-Silicates Qichi Hu, K. Kjoller, Anasys Instruments, G. Stan, NIST/Material Measurement Laboratory, S.W. King, Intel Corporation |
| 5:40pm | NS-TuA11 Scanning Microwave Microscopy Imaging in Liquids through Ultra-Thin Membranes Alexander Tselev, Oak Ridge National Laboratory, J. Velmurugan, National Institute of Standards and Technology (NIST), University of Maryland (UMD), A. Kolmakov, NIST/CNST |
| 6:00pm | NS-TuA12 SnS Nanoplates Nancy Trejo, A. Hunter, C. Wrasman, S. Ganguly, University of Minnesota, J. Dwyer, St. Catherine University, E.S. Aydil, University of Minnesota |