| AVS 63rd International Symposium & Exhibition | |
| Nanometer-scale Science and Technology | Tuesday Sessions |
| Session NS-TuA |
| Session: | Nanoscale Imaging and Characterization |
| Presenter: | Ricardo Garcia, CSIC, Spain |
| Correspondent: | Click to Email |
This contribution aims to provide an overview of some recent developments as well as some challenges faced by force microscopy in nanoscience and nanotechnology. Specifically, the focus will be oriented to applications to study materials in air and liquid environments. The presentation is divided in three sections. The first section provides an introduction to the physics and key instrumental aspects of advanced force microscopes. The second section describes some applications to generate high resolution (atomic, molecular or nanoscale) maps of soft matter interfaces (polymer and biomolecules). Those maps combined topography and nanomechanical properties. A method to generate three dimensional and atomically-resolved mapsof solid-liquid interfaces will be presented. The third section, illustrates how the nanoscale control afforded by scanning probe microscopes has enabled the development of scanning probe-based patterning methods.
References:
E.T. Herruzo, A.P. Perrino and R. Garcia, Nature Commun. 5, 3126 (2014)
R. Garcia and E. T. Herruzo, Nature Nanotechnol. 7, 217-226 (2012).
R.Garcia, A.W. Knoll, E. Riedo, Nature Nanotechnology 9, 577-587 (2014)