AVS 63rd International Symposium & Exhibition
    Exhibitor Technology Spotlight Wednesday Sessions

Session EW-WeL
Exhibitor Technology Spotlight Session

Wednesday, November 9, 2016, 12:20 pm, Room Hall C
Moderator: Chris Moffitt, Kratos Analytical Limited


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

1:00pm EW-WeL3
Why Test Inks Cannot Tell the Full Truth About Surface Free Energy
Thomas Willers, M. Jin, KRUSS
1:20pm EW-WeL4
A Vacuum Species Sensor using Remote Plasma Emission Spectroscopy for Direct Monitoring of Vacuum Processes
Joseph Brindley, D. Benoit, V. Bellido-Gonzalez, Gencoa Limited, UK
1:40pm EW-WeL5
Raman Imaging of Samples with Complex surface Topographies Using Renishaw’s inVia Qontor
Tim Prusnick, RENISHAW, INC.
2:00pm EW-WeL6
Ampoules and Bubblers 101
William Kimmerle, K.S. Kimmerle, NSI