AVS 63rd International Symposium & Exhibition
    Exhibitor Technology Spotlight Wednesday Sessions
       Session EW-WeL

Paper EW-WeL5
Raman Imaging of Samples with Complex surface Topographies Using Renishaw’s inVia Qontor

Wednesday, November 9, 2016, 1:40 pm, Room Hall C

Session: Exhibitor Technology Spotlight Session
Presenter: Tim Prusnick, RENISHAW, INC.
Correspondent: Click to Email

Recent advancements in hardware and software have been made to enable micro-Raman focus to be maintained over large areas during data collection. These developments allow analysis of samples that in the past were impractical or even impossible because of variations in surface topography. With the addition of Renishaw's latest innovation, Live Track™ focus tracking technology, the inVia Qontor enables users to analyze samples with uneven, curved or rough surfaces.