| AVS 63rd International Symposium & Exhibition | |
| Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
| Session EL+AS+BI+EM+TF-ThA |
| Session: | Optical Characterization of Nanostructures and Metamaterials (2:20-3:40 pm)/Application of Spectroscopic Ellipsometry for the Characterization of Thin Films (4:00-6:00 pm) and Biological Materials Interfaces |
| Presenter: | Morten Kildemo, Norwegian University of Science and Technology, Norway |
| Correspondent: | Click to Email |