AVS 63rd International Symposium & Exhibition | |
Spectroscopic Ellipsometry Focus Topic | Thursday Sessions |
Session EL+AS+BI+EM+TF-ThA |
Session: | Optical Characterization of Nanostructures and Metamaterials (2:20-3:40 pm)/Application of Spectroscopic Ellipsometry for the Characterization of Thin Films (4:00-6:00 pm) and Biological Materials Interfaces |
Presenter: | Morten Kildemo, Norwegian University of Science and Technology, Norway |
Correspondent: | Click to Email |