| AVS 62nd International Symposium & Exhibition | |
| Exhibitor Technology Spotlight | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 12:40pm | EW-TuL2 The Latest Developments in Surface Analysis from Thermo Fisher Scientific Tim Nunney, Thermo Fisher Scientific, UK, P. Mack, C. Deeks, R.G. White, Thermo Fisher Scientific |
| 1:00pm | EW-TuL3 EnviroESCA – The Revolution of a Method Andreas Thissen, S. Bahr, T. Kampen, O. Schaff, SPECS Surface Nano Analysis GmbH, Germany |
| 1:20pm | EW-TuL4 Latest Developments in XPS and Related Methods from Kratos Analytical Chris Blomfield, J.D.P. Counsell, S.J. Coultas, S.C. Page, Kratos Analytical Limited, UK, C. Moffitt, Kratos Analytical Limited |
| 1:40pm | EW-TuL5 What's New from Physical Electronics Scott Bryan, Physical Electronics USA |
| 2:00pm | EW-TuL6 AFM of Thin Films for Nanomechanical, Nanoelectrical, and Electromechanical Characterization Amir Moshar, A. Labuda, Asylum Research, an Oxford Instruments Company |